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Toshiba TOSHIBA Diode Silicon Epitaxial Planar Type 1SV325 Data Sheet

Summary

This data sheet provides comprehensive technical details for the 1SV325, a high-performance Toshiba semiconductor diode/capacitor designed for precision applications like small-size tuners in VCO/TCXO circuits. It covers key operational specifications including capacitance ratios, low series resistance values, and maximum ratings against temperature and voltage fluctuation. This manual is essential for electrical engineers and hardware designers who require reliable components for general electronics, measuring equipment, and advanced RF circuit development, ensuring proper integration and safe application within specified operating parameters.

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1SV325

TOSHIBA Diode Silicon Epitaxial Planar Type

1SV325

TCXO/VCO

Unit: mm

High capacitance ratio: C1 V/C4 V = 4.3 (typ.) Low series resistance: rs = 0.4 Ω (typ.) Useful for small size tuner.

Maximum Ratings (Ta  25°C)

Characteristics Symbol Rating Unit

Reverse voltage VR 10 V Junction temperature Tj 125 °C Storage temperature range Tstg 55~125 °C

JEDEC ― JEITA ― TOSHIBA 1-1G1A

Weight: 0.0014 g (typ.)

Electrical Characteristics (Ta  25°C)

Characteristics Symbol Test Condition Min Typ. Max Unit

Reverse voltage VR IR  1 A 10   V Reverse current IR VR  10 V   3 n A Capacitance C1 V VR  1 V, f  1 MHz 44  49.5 p F Capacitance C4 V VR  4 V, f  1 MHz 9.2  12 p F Capacitance ratio C1 V/C4 V  4 4.3 Series resistance rs VR  4 V, f  100 MHz  0.4 0.8

Note: Signal level when capacitance is measured: Vsig  500 m Vfms

Marking

Page Summary Contents For Toshiba TOSHIBA Diode Silicon Epitaxial Planar Type 1SV325 Data Sheet

Page 1 1SV325 TOSHIBA Diode Silicon Epitaxial Planar Type 1SV325 TCXO/VCO Unit: mm High capacitance ratio: C1 V/C4 V = 4.3 (typ.) Low series resistance: rs = 0.4 Ω (typ.) Useful for small size tuner. Maximum...
Page 2 1SV325
Page 3 1SV325 000707EAARESTRICTIONS ON PRODUCT USE TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fai...