Texas Instruments SN54AHCT00, SN74AHCT00 Data Sheet Manual

查询SN54AHCT00供应商 SN54AHCT00, SN74AHCT00

QUADRUPLE 2-INPUT POSITIVE-NAND GATES

SCLS229H – OCTOBER 1995 – REVISED JANUARY 2000

EPIC (Enhanced-Performance Implanted SN54AHCT00 J OR W PACKAGE SN74AHCT00 D, DB, DGV, N, OR PW PACKAGE

CMOS) Process

(TOP VIEW)

Inputs Are TTL-Voltage Compatible Latch-Up Performance Exceeds 250 m A Per 1A VCC JESD 17 1B 4B

ESD Protection Exceeds 2000 V Per 1Y 4A MIL-STD-883, Method 3015; Exceeds 200 V 2A 4Y Using Machine Model (C = 200 p F, R = 0) 2B 3B 2Y 3A

Package Options Include Plastic

Small-Outline (D), Shrink Small-Outline GND 3Y

(DB), Thin Very Small-Outline (DGV), Thin Shrink Small-Outline (PW), and Ceramic Flat SN54AHCT00 FK PACKAGE

(W) Packages, Ceramic Chip Carriers (FK), (TOP VIEW)

and Standard Plastic (N) and Ceramic (J) DIPs

description 1Y 4A

NC NC

The ’AHCT00 devices perform the Boolean

function Y = A • B or Y = A + B in positive logic.

NC NC

The SN54AHCT00 is characterized for operation 2B 3B over the full military temperature range of –55°C to 125°C. The SN74AHCT00 is characterized for operation from –40°C to 85°C.

NC – No internal connection

FUNCTION TABLE (each gate)

INPUTS OUTPUT

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

EPIC is a trademark of Texas Instruments Incorporated.

PRODUCTION DATA information is current as of publication date. Copyright  2000, Texas Instruments Incorporated

Products conform to specifications per the terms of Texas Instruments On products compliant to MIL-PRF-38535, all parameters are tested standard warranty. Production processing does not necessarily include unless otherwise noted. On all other products, production testing of all parameters. processing does not necessarily include testing of all parameters.

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