Texas Instruments CD54ACT86, CD74ACT86 QUADRUPLE 2-INPUT EXCLUSIVE-OR GATES Data Sheet Manual

CD54ACT86, CD74ACT86

QUADRUPLE 2-INPUT EXCLUSIVE-OR GATES

SCHS322 – JANUARY 2003

Inputs Are TTL-Voltage Compatible CD54ACT86 F PACKAGE CD74ACT86 E OR M PACKAGE

Speed of Bipolar F, AS, and S, With

(TOP VIEW)

Significantly Reduced Power Consumption

Balanced Propagation Delays 1A VCC

±24-m A Output Drive Current

– Fanout to 15 F Devices

SCR-Latchup-Resistant CMOS Process and

Circuit Design

Exceeds 2-k V ESD Protection Per

GND 3Y

MIL-STD-883, Method 3015

description/ordering information The ’ACT86 devices are quadruple 2-input exclusive-OR gates. These devices perform the Boolean function Y = A ⊕ B or Y = AB + AB in positive logic. A common application is as a true/complement element. If one of the inputs is low, the other input is reproduced in true form at the output. If one of the inputs is high, the signal on the other input is reproduced inverted at the output.

ORDERING INFORMATION

ORDERABLE TOP-SIDE

TA PACKAGE†

PART NUMBER MARKING

PDIP – E Tube CD74ACT86E CD74ACT86E

Tube CD74ACT86M

55°C to 125°C SOIC ACT86M–

Tape and reel CD74ACT86M96

CDIP – F Tube CD54ACT86F3A CD54ACT86F3A

Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at www.ti.com/sc/package.

FUNCTION TABLE (each gate) INPUTS OUTPUT

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date. Copyright  2003, Texas Instruments Incorporated

Products conform to specifications per the terms of Texas Instruments On products compliant to MIL-PRF-38535, all parameters are tested standard warranty. Production processing does not necessarily include unless otherwise noted. On all other products, production testing of all parameters. processing does not necessarily include testing of all parameters.

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