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AMD DS42553 Handbook

Summary

This technical manual provides comprehensive information on the DS42553 MCP device, a high-performance 32Mbit Flash Memory and 4 Mbit SRAM solution designed for advanced embedded systems. It details architectural improvements such as zero-latency read/write operations and Secured Silicon (SecSi) technology for secure data management. The guide covers hardware features, performance specifications, power consumption profiles, and software methods using the Data Management Software (DMS). Ideal for system engineers designing low-power, high-reliability devices that require non-volatile, protected storage capabilities.

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查询DS42553供应商

DS42553 Stacked Multi-Chip Package (MCP) Flash Memory and SRAM Am29DL323D Top Boot 32 Megabit (4 M x 8-Bit/2 M x 16-Bit) CMOS 3.0 Volt-only, Simultaneous Operation Flash Memory and 4 Mbit (512 K x 8-Bit/ 256 K x 16-Bit) Static RAM

DISTINCTIVE CHARACTERISTICS

MCP Features SOFTWARE FEATURES Power supply voltage of 2.7 to 3.3 volt Data Management Software (DMS) AMD-supplied software manages data programming and

High performance

erasing, enabling EEPROM emulation

90 ns maximum access time

Eases sector erase limitations

Package

Supports Common Flash Memory Interface (CFI)

73-Ball FBGA

Erase Suspend/Erase Resume

Operating Temperature

Suspends erase operations to allow programming in same

–25°C to +85°C

Flash Memory Features Data# Polling and Toggle Bits Provides a software method of detecting the status of program or erase cycles

ARCHITECTURAL ADVANTAGES

Unlock Bypass Program command

Simultaneous Read/Write operations

Reduces overall programming time when issuing multiple

Data can be continuously read from one bank while

program command sequences

executing erase/program functions in other bank Zero latency between read and write operations

HARDWARE FEATURES

Secured Silicon (Sec Si) Sector: Extra 64 KByte sector

Any combination of sectors can be erased

Factory locked and identifiable: 16 bytes available for

secure, random factory Electronic Serial Number; verifiable Ready/Busy# output (RY/BY#)

as factory locked through autoselect function. Hardware method for detecting program or erase cycle

Customer lockable: Can be read, programmed, or erased completion

just like other sectors. Once locked, data cannot be changed

Hardware reset pin (RESET#)

Zero Power Operation Hardware method of resetting the internal state machine to

Sophisticated power management circuits reduce power reading array data

consumed during inactive periods to nearly zero

WP#/ACC input pin

Top boot block Write protect (WP#) function allows protection of two outermost

boot sectors, regardless of sector protect status

Manufactured on 0.23 µm process technology

Acceleration (ACC) function accelerates program timing

Compatible with JEDEC standards

Sector protection

Pinout and software compatible with single-power-supply

Hardware method of locking a sector, either in-system or

flash standard

using programming equipment, to prevent any program or erase operation within that sector

PERFORMANCE CHARACTERISTICS

Temporary Sector Unprotect allows changing data in

High performance protected sectors in-system Access time as fast 70 ns Program time: 7 µs/word typical utilizing Accelerate function SRAM Features Ultra low power consumption (typical values) Power dissipation 2 m A active read current at 1 MHz Operating: 50 m A maximum 10 m A active read current at 5 MHz Standby: 7 µA maximum 200 n A in standby or automatic sleep mode

CE1s# and CE2s Chip Select

Minimum 1 million write cycles guaranteed per sector Power down features using CE1s# and CE2s

20 Year data retention at 125°C Data retention supply voltage: 1.5 to 3.3 volt Reliable operation for the life of the system Byte data control: LB#s (DQ0–DQ7), UB#s (DQ8–DQ15)

This document contains information on a product under development at Advanced Micro Devices. The information Publication# 24218 Rev: B Amendment/1

is intended to help you evaluate this product. AMD reserves the right to change or discontinue work on this proposed Issue Date: March 15, 2001 product without notice.

Refer to AMD’s Website (www.amd.com) for the latest information.

Page Summary Contents For AMD DS42553 Handbook

Page 1 查询DS42553供应商 DS42553 Stacked Multi-Chip Package (MCP) Flash Memory and SRAM Am29DL323D Top Boot 32 Megabit (4 M x 8-Bit/2 M x 16-Bit) CMOS 3.0 Volt-only, Simultaneous Operation Flash Memory and 4 Mbit...
Page 2 GENERAL DESCRIPTION Am29DL323 Features of the simultaneous read/write product line by allowing removal of EEPROM devices. DMS will also allow the The Am29DL323 is a 32 megabit, 3.0 volt-only flash sys...
Page 3 TABLE OF CONTENTS Distinctive Characteristics . . . . . . . . . . . . . . . . . . 1 Sec Si (Secured Silicon) Sector Flash Memory MCP Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . Re...
Page 4 Key To Switching Waveforms. . . . . . . . . . . . . . . 36 SRAM Read Cycle . . . . . . . . . . . . . . . . . . . . . . . 50 Figure 12. Input Waveforms and Figure 28. SRAM Read Cycle—Address Measuremen...
Page 5 PRODUCT SELECTOR GUIDE Part Number DS42553 Standard Voltage Range: VCC = 2.7–3.3 V Flash Memory SRAM Max Access Time (ns) CE# Access (ns) OE# Access (ns) MCP BLOCK DIAGRAM VSSVCCf A0 to A20 RY/BY# A0 ...
Page 6 FLASH MEMORY BLOCK DIAGRAM OE# BYTE# VCC VSS Upper Bank Address A0–A20 Upper Bank RY/BY# A0–A20 X-Decoder RESET# STATE CONTROL Status DQ0–DQ15 COMMAND BYTE# REGISTER Control WP#/ACC DQ0–DQ15 X-Decoder...
Page 7 CONNECTION DIAGRAM 73-Ball FBGA Top View A1 A10 Flash only NC NC SRAM only NC NC NC NC Shared NC A7 LB# WP#/ACC WE# A8 A11 A3 A6 UB# RESET# CE2s A19 A12 A15 E2 E3 E4 E5 E6 E7 E8 E9 A2 A5 A18 RY/BY# A2...
Page 8 PIN DESCRIPTION LOGIC SYMBOL A0–A17 18 Address Inputs (Common) A-1, A18–A20 4 Address Inputs (Flash) A0–A17 SA Highest Order Address Pin (SRAM) Byte mode DQ0–DQ15 16 Data Inputs/Outputs (Common) 16 or...
Page 9 Table 1. Device Bus Operations—Flash Word Mode, CIOf = VIH; SRAM Word Mode, CIOs = VCC Operation WP#/ACC CE#f CE1#s CE2s OE# WE# SA LB#s UB#s RESET# DQ0– DQ7 DQ8–DQ15 (Notes 1, 2) (Note 3) Read from F...
Page 10 Table 2. Device Bus Operations—Flash Word Mode, CIOf = VIH; SRAM Byte Mode, CIOs = VSS Operation LB#s UB#s WP#/ACC CE#f CE1#s CE2s OE# WE# SA RESET# DQ0–DQ7 DQ8–DQ15 (Notes 1, 2) (Note 3) (Note 3) (No...
Page 11 Table 3. Device Bus Operations—Flash Byte Mode, CIOf = VIL; SRAM Byte Mode, CIOs = VSS Operation DQ15/ LB#s UB#s WP#/ACC CE#f CE1#s CE2s OE# WE# SA RESET# DQ0–DQ7 DQ8–DQ15 (Notes 1, 2) A–1 (Note 3) (N...
Page 12 Word/Byte Configuration An erase operation can erase one sector, multiple sec- tors, or the entire device. Tables 5–6 indicate the The CIOf pin controls whether the device data I/O pins address space ...
Page 13 Standby Mode RESET# pin is driven low for at least a period of t RP, the device immediately terminates any operation in When the system is not reading or writing to the de- progress, tristates all out...
Page 14 Table 5. Sector Addresses for Top Boot Sector Devices an 3D Sector Address Sector Size (x8) (x16) Sector A20–A12 (Kbytes/Kwords) Address Range Address Range SA0 000000xxx 64/32 000000h–00FFFFh 000000h...
Page 15 Table 5. Sector Addresses for Top Boot Sector Devices (Continued) an 3D Sector Address Sector Size (x8) (x16) Sector A20–A12 (Kbytes/Kwords) Address Range Address Range SA48 110000xxx 64/32 300000h–30...
Page 16 Autoselect Mode Sector/ Sector A20–A12 Sector Block Size The autoselect mode provides manufacturer and de- SA67 8 Kbytes vice identification, and sector protection verification, through identifier cod...
Page 17 Note that the WP#/ACC pin must not be left floating or unconnected; inconsistent behavior of the device may result. START Temporary Sector/Sector Block Unprotect (Note: For the following discussion, t...
Page 18 START START Protect all sectors: PLSCNT = 1 PLSCNT = 1 The indicated portion of the sector protect algorithm must be RESET# = VID RESET# = VID performed for all unprotected sectors Wait 1 µs Wait 1 µs...
Page 19 Sec Si (Secured Silicon) Sector Flash and erased as often as required. Note that the acceler- ated programming (ACC) and unlock bypass functions Memory Region are not available when programming the Se...
Page 20 CE#f and WE# must be a logical zero while OE# is a This device enters the CFI Query mode when the sys- logical one. tem writes the CFI Query command, 98h, to address 55h in word mode (or address AAh i...
Page 21 Table 9. System Interface String Addresses Addresses Data Description (Word Mode) (Byte Mode) VCC Min. (write/erase) 1Bh 36h 0027h D7–D4: volt, D3–D0: 100 millivolt VCC Max. (write/erase) 1Ch 38h 0036...
Page 22 Table 11. Primary Vendor-Specific Extended Query Addresses Addresses Data Description (Word Mode) (Byte Mode) 40h 80h 0050h 41h 82h 0052h Query-unique ASCII string “PRI” 42h 84h 0049h 43h 86h 0031h Ma...
Page 23 COMMAND DEFINITIONS Writing specific address and data commands or se- which the system was writing to reading array data. If quences into the command register initiates device the program command sequ...
Page 24 Enter Sec Si Sector/Exit Sec Si Sector ful. However, a succeeding read will show that the data is still “0.” Only erase operations can convert a Command Sequence “0” to a “1.” The system can access th...
Page 25 mediately terminates the erase operation. If that occurs, the chip erase command sequence should be reinitiated once that bank has returned to reading array data, to ensure data integrity. START Figur...
Page 26 Refer to the Write Operation Status section for infor- program operation using the DQ7 or DQ6 status bits, mation on these status bits. just as in the standard Byte Program operation. Refer to the Wri...
Page 27 Table 12. DS42553 Command Definitions ut os el ec t ( ot 8) Bus Cycles (Notes 2–5) Command First Second Third Fourth Fifth Sixth Sequence (Note 1) Addr Data Addr Data Addr Data Addr Data Addr Data Add...
Page 28 WRITE OPERATION STATUS The device provides several bits to determine the sta- valid data, the data outputs on DQ0–DQ6 may be still tus of a program or erase operation: DQ2, DQ3, DQ5, invalid. Valid da...
Page 29 RY/BY#: Ready/Busy# DQ6 also toggles during the erase-suspend-program mode, and stops toggling once the Embedded Pro- The RY/BY# is a dedicated, open-drain output pin gram algorithm is complete. which...
Page 30 DQ2: Toggle Bit II cles, determining the status as described in the previous paragraph. Alternatively, it may choose to The “Toggle Bit II” on DQ2, when used with DQ6, indi- perform other system tasks...
Page 31 Table 13. Write Operation Status DQ7 DQ5 DQ2 Status DQ6 DQ3 RY/BY# (Note 2) (Note 1) (Note 2) Standard Embedded Program Algorithm DQ7# Toggle N/A No toggle Mode Embedded Erase Algorithm Toggle Toggle ...
Page 32 ABSOLUTE MAXIMUM RATINGS OPERATING RANGES Storage Temperature Industrial (I) Devices Plastic Packages . . . . . . . . . . . . . . . –55°C to +125°C Ambient Temperature (TA) . . . . . . . . .–25°C to +...
Page 33 DC CHARACTERISTICS CMOS Compatible Parameter Parameter Description Test Conditions Min Typ Max Unit Symbol VIN = VSS to VCC, ILI Input Load Current ±1.0 µA VCC = VCC max ILIT RESET# Input Load Current...
Page 34 DC CHARACTERISTICS (Continued) CMOS Compatible Parameter Parameter Description Test Conditions Min Typ Max Unit Symbol Voltage for WP#/ACC Program VHH Acceleration and Sector 8.5 9.5 Protection/Unprot...
Page 35 DC CHARACTERISTICS ly rr en in Zero-Power Flash up pl ur re nt in Time in ns Note: Addresses are switching at 1 MHz Figure 9. ICC1 Current vs. Time (Showing Active and Automatic Sleep Currents) Freque...
Page 36 TEST CONDITIONS Table 14. Test Specifications Test Condition 90 ns Unit Output Load 1 TTL gate Device Output Load Capacitance, CL Under p F (including jig capacitance) Input Rise and Fall Times ns CL ...
Page 37 AC CHARACTERISTICS SRAM CE#s Timing Parameter Speed Test Setup Unit JEDEC Std Description t CCR CE#s Recover Time Min ns t CCR t CCR t CCR t CCR Figure 13. Timing Diagram for Alternating Between SRAM ...
Page 38 AC CHARACTERISTICS Flash Read-Only Operations Parameter 90 ns Speed Test Setup Unit JEDEC Std Description Min Max t AVAV t RC Read Cycle Time (Note 1) ns t AVQV t ACC Address to Output Delay CE#f, OE#...
Page 39 AC CHARACTERISTICS Hardware Reset (RESET#) Parameter Description 90 ns Unit JEDEC Std RESET# Pin Low (During Embedded Algorithms) t Ready Max µs to Read Mode (See Note) RESET# Pin Low (NOT During Embe...
Page 40 AC CHARACTERISTICS Flash Word/Byte Configuration (CIOf) Parameter 90 ns Speed JEDEC Std Description Min Typ Max Unit t ELFL/t ELFH CE#f to CIOf Switching Low or High ns t FLQZ CIOf Switching Low to Ou...

Manual Details

Brand AMD
Pages 58
File Size 482.00 KB
Published May 14, 2026
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Frequently Asked Questions

How does this chip improve read/write performance?

By allowing simultaneous read/write operations, it reduces overall programming time and offers zero latency between read and write operations.

What security features are built into the memory?

It includes a Secured Silicon (SecSi) sector that can be factory locked or customer lockable to prevent any data changes.

Is this device compliant with industry standards?

Yes, it supports the Common Flash Memory Interface (CFI) and is pinout/software compatible with JEDEC standards.

What are its power consumption characteristics?

In standby mode, the maximum consumption is very low at 7 µA, making it reliable for long-life system operation.